Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films (vol 233, pg 297, 2004)

dc.contributor.author	VASA, P
dc.contributor.author	SINGH, BP
dc.contributor.author	TANEJA, P
dc.contributor.author	AYYUB, P
dc.date.accessioned	2011-10-10T07:51:17Z
dc.date.accessioned	2011-12-15T09:02:36Z
dc.date.available	2011-10-10T07:51:17Z
dc.date.available	2011-12-15T09:02:36Z
dc.date.issued	2004
dc.identifier.citation	OPTICS COMMUNICATIONS,237,451-451	en_US
dc.identifier.issn	0030-4018
dc.identifier.uri	http://dx.doi.org/10.1016/j.optcom.2004.05.002
dc.identifier.uri	en	en_US
dc.identifier.uri	http://dspace.library.iitb.ac.in/xmlui/handle/10054/13060
dc.identifier.uri	http://hdl.handle.net/100/63
dc.language.iso	ELSEVIER SCIENCE BV	en_US
dc.subject.other	Antiresonant Ring Interferometry As A Sensitive Technique For Measuring Nonlinear Optical Properties Of Thin Films (Vol 233, Pg 297, 2004)	en_US
dc.title	Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films (vol 233, pg 297, 2004)	en_US
dc.type	Correction	en_US