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Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films (vol 233, pg 297, 2004)

Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films (vol 233, pg 297, 2004)

VASA, P; SINGH, BP; TANEJA, P; AYYUB, P
URI: http://dx.doi.org/10.1016/j.optcom.2004.05.002
en
http://dspace.library.iitb.ac.in/xmlui/handle/10054/13060
http://hdl.handle.net/100/63
Date: 2004

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