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Determining the optimal standard test condition correction procedure for high-throughput field I–V measurements of photovoltaic modules

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dc.contributor.author GOLIVE Y.R.
dc.contributor.author KOTTANTHARAYIL A.
dc.contributor.author VASI J.
dc.contributor.author SHIRADKAR N.
dc.date.accessioned 2023-03-17T04:40:13Z
dc.date.available 2023-03-17T04:40:13Z
dc.date.issued 2022
dc.identifier.citation Progress in Photovoltaics: Research and Applications,30(1)13-26 en_US
dc.identifier.issn 10627995
dc.identifier.uri https://dx.doi.org/10.1002/pip.3457
dc.identifier.uri http://localhost:8080/xmlui/handle/100/38028
dc.description.abstract The field-measured current–voltage (i–v) curves of photovoltaic (pv) modules need to be corrected to standard test conditions (stc) in order to estimate the degradation rates. Stc correction procedures have various attributes such as accuracy, requirement of minimum number and types of i–v curves, required irradiance range, and the type of correction (specific points or entire i–v curve) that determine their optimality for specific applications. This paper presents the investigation of accuracy and constraints of six different stc correction procedures for high-throughput field i–v measurements through experimental and simulation studies. Following stc correction procedures are considered in this paper: iec 60891-procedure 1, iec 60891-procedure 2, modified iec 60891-procedure 1, standard irradiance and desired temperature (sidt) procedure, anderson procedure, and voltage-dependent temperature coefficient (vdtc) procedure. Eight different simulation models for predicting the performance of pv modules at arbitrary irradiance and temperature are compared, and the simulation model that yields lowest root mean square error and the most accurate estimation of power temperature coefficient is identified. The simulated i–v curves using this model and the experimentally measured i–v curves on a flash tester at different temperatures and irradiances are provided as an input to all of the stc correction procedures. The average percentage errors in correction of maximum power (pmax), open-circuit voltage (voc), short-circuit current (isc), and fill factor (ff) were determined as a function of irradiance and temperature during measurement. Systematic biases introduced during correction by certain procedures were also identified. Based on the error estimation, constraints of various procedures, and requirements of high-throughput field i–v measurements, the most optimal stc correction procedure was identified. Moreover, the analysis of the root cause of superior performance of this procedure is also presented. © 2021 john wiley & sons, ltd. en_US
dc.language.iso English en_US
dc.publisher John Wiley and Sons Ltd en_US
dc.subject AVERAGE PERCENTAGE ERROR en_US
dc.subject CORRECTION en_US
dc.subject CURRENT–VOLTAGE CHARACTERISTICS en_US
dc.subject EQUIVALENT CELL TEMPERATURE en_US
dc.subject EXPERIMENT en_US
dc.subject FILL FACTOR en_US
dc.subject MAXIMUM POWER en_US
dc.subject OPEN-CIRCUIT VOLTAGE en_US
dc.subject PHOTOVOLTAIC MODULE en_US
dc.subject SHORT-CIRCUIT CURRENT en_US
dc.subject SIMULATION en_US
dc.subject STANDARD TEST CONDITIONS en_US
dc.subject.other Degradation en_US
dc.subject.other Errors en_US
dc.subject.other Mean square error en_US
dc.subject.other Open circuit voltage en_US
dc.subject.other Photovoltaic cells en_US
dc.subject.other Accurate estimation en_US
dc.subject.other Correction procedure en_US
dc.subject.other Measured currents en_US
dc.subject.other Photovoltaic modules en_US
dc.subject.other Root mean square errors en_US
dc.subject.other Simulation studies en_US
dc.subject.other Standard test condition (STC) en_US
dc.subject.other Temperature coefficient en_US
dc.subject.other Temperature en_US
dc.title Determining the optimal standard test condition correction procedure for high-throughput field I–V measurements of photovoltaic modules en_US
dc.type Article en_US


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