MADDI H.L.R.; YU S.; ZHU S.; LIU T.; SHI L.; KANG M.; XING D.; NAYAK S.; WHITE M.H.; AGARWAL A.K.
(MDPI, 2021)
This article provides a detailed study of performance and reliability issues and trade-offs in silicon carbide (sic) power mosfets. The reliability issues such as threshold voltage variation across devices from the same ...