Special Issue on Reliability

MAHAPATRA, S; KERBER, A; COMPAGNONI, CM; KOVAL, R; MENEGHESSO, G; SHERIDAN, D; RAMEY, S; WANG, RS; STATHIS, J; CHEN, KJ; KACZER, B; PANCHERI, L; ROSENBAUM, E; MOULI, C; WONG, H

dc.contributor.author	MAHAPATRA, S
dc.contributor.author	KERBER, A
dc.contributor.author	COMPAGNONI, CM
dc.contributor.author	KOVAL, R
dc.contributor.author	MENEGHESSO, G
dc.contributor.author	SHERIDAN, D
dc.contributor.author	RAMEY, S
dc.contributor.author	WANG, RS
dc.contributor.author	STATHIS, J
dc.contributor.author	CHEN, KJ
dc.contributor.author	KACZER, B
dc.contributor.author	PANCHERI, L
dc.contributor.author	ROSENBAUM, E
dc.contributor.author	MOULI, C
dc.contributor.author	WONG, H
dc.date.accessioned	2021-03-10T08:19:48Z
dc.date.available	2021-03-10T08:19:48Z
dc.date.issued	2019
dc.identifier.citation	IEEE TRANSACTIONS ON ELECTRON DEVICES 66, 4497-4503	en_US
dc.identifier.issn	0018-9383
dc.identifier.issn	1557-9646
dc.identifier.uri	http://localhost:8080/xmlui/handle/100/29543
dc.language.iso	English	en_US
dc.publisher	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC	en_US
dc.title	Special Issue on Reliability	en_US
dc.type	Editorial Material	en_US