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Soft-error reliable architecture for future microprocessors

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dc.contributor.author GOPALAKRISHNAN, S
dc.contributor.author SINGH, V
dc.date.accessioned 2021-03-10T07:40:33Z
dc.date.available 2021-03-10T07:40:33Z
dc.date.issued 2019
dc.identifier.citation IET COMPUTERS AND DIGITAL TECHNIQUES 13(3)233-242 en_US
dc.identifier.issn 1751-8601
dc.identifier.issn 1751-861X
dc.identifier.uri https://doi.org/10.1049/iet-cdt.2018.5015
dc.identifier.uri http://localhost:8080/xmlui/handle/100/25923
dc.description.abstract The transient error is the failure of the device due to transient hardware faults caused by high-energy particles like neutron and alpha particle strikes. In this study, the authors propose two schemes of fault-tolerant architecture. The first scheme is a hardware-based solution called REMO that combines the best features of space and time redundancy. REMO provides very high fault coverage with minimum overheads in performance, power and area. The second scheme, REMORA combines the best features of hardware and software approaches of fault tolerance. The persistent issue of unprotected code which exists in software approaches is eliminated in this proposal. Simulation results from a SPEC2006 benchmark suite indicate, REMO incurs an increase in the area of about 6%, power overhead is 9% in spite of redundant execution and a negligible performance penalty during a fault-free run. In REMORA, performance degradation increases to 12%. The code size inflation is close to 12%. This is due to the additional signature instructions inserted into the application program. In this study, the authors have explored the possibility of eliminating this penalty by embedding the signatures in control flow instructions. The power and area overhead of REMORA is on par with REMO. en_US
dc.language.iso English en_US
dc.publisher INST ENGINEERING TECHNOLOGY-IET en_US
dc.subject REDUNDANCY en_US
dc.subject FAULT TOLERANT COMPUTING en_US
dc.subject SECURITY OF DATA en_US
dc.subject FAULT TOLERANCE en_US
dc.subject INTEGRATED CIRCUIT RELIABILITY en_US
dc.subject MICROPROCESSOR CHIPS en_US
dc.subject INSTRUCTION SETS en_US
dc.subject SOFT-ERROR RELIABLE ARCHITECTURE en_US
dc.subject FUTURE MICROPROCESSORS en_US
dc.subject TRANSIENT ERROR en_US
dc.subject TRANSIENT HARDWARE FAULTS en_US
dc.subject HIGH-ENERGY PARTICLES en_US
dc.subject NEUTRON en_US
dc.subject ALPHA PARTICLE STRIKES en_US
dc.subject FAULT-TOLERANT ARCHITECTURE en_US
dc.subject HARDWARE-BASED SOLUTION en_US
dc.subject REMO en_US
dc.subject TIME REDUNDANCY en_US
dc.subject HIGH FAULT COVERAGE en_US
dc.subject MINIMUM OVERHEADS en_US
dc.subject REMORA en_US
dc.subject SOFTWARE APPROACHES en_US
dc.subject FAULT TOLERANCE en_US
dc.subject PERSISTENT ISSUE en_US
dc.subject UNPROTECTED CODE en_US
dc.subject SIMULATION RESULTS en_US
dc.subject SPEC2006 BENCHMARK SUITE en_US
dc.subject POWER OVERHEAD en_US
dc.subject REDUNDANT EXECUTION en_US
dc.subject NEGLIGIBLE PERFORMANCE PENALTY en_US
dc.subject FAULT-FREE RUN en_US
dc.subject PERFORMANCE DEGRADATION INCREASES en_US
dc.subject CODE SIZE INFLATION en_US
dc.subject LOW-COST en_US
dc.title Soft-error reliable architecture for future microprocessors en_US
dc.type Article en_US


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