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Development of fault-tolerant MLI topology

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dc.contributor.author JALHOTRA, M
dc.contributor.author KUMAR, L
dc.contributor.author GAUTAM, SP
dc.contributor.author GUPTA, S
dc.date.accessioned 2018-12-03T07:24:51Z
dc.date.available 2018-12-03T07:24:51Z
dc.date.issued 2018
dc.identifier.citation IET POWER ELECTRONICS,11(8)1416-1424 en_US
dc.identifier.issn 1755-4535;1755-4543
dc.identifier.uri http://dx.doi.org/10.1002/2014GL060595
dc.identifier.uri http://dspace.library.iitb.ac.in/xmlui/handle/100/22781
dc.description.abstract Multilevel inverters (MLIs) have developed deep roots in various industrial sectors owing to their advantages over conventional two-level inverters. However, the reliability of the semiconductor devices has been one of the major concerns for the proper functioning of MLI. Therefore, a novel fault-tolerant topology is proposed in this study. The proposed topology is capable to tolerate single- and multi-switch faults. It has lesser device count compared with the most recent work in the field. Moreover, it achieves inherent voltage balancing across capacitors. The proposed fault-tolerant topology is simulated in MATLAB/Simulink and validated experimentally. en_US
dc.language.iso English en_US
dc.publisher INST ENGINEERING TECHNOLOGY-IET en_US
dc.subject capacitors en_US
dc.subject fault tolerance en_US
dc.subject invertors en_US
dc.subject lesser device count en_US
dc.subject fault-tolerant MLI topology en_US
dc.subject multilevel inverters en_US
dc.subject MLIs en_US
dc.subject deep roots en_US
dc.subject industrial sectors en_US
dc.subject two-level inverters en_US
dc.subject semiconductor devices en_US
dc.subject novel fault-tolerant topology en_US
dc.subject multiswitch faults en_US
dc.subject CONVERTER-BASED STATCOM en_US
dc.subject CLAMPED CONVERTER en_US
dc.subject INVERTER en_US
dc.subject RELIABILITY en_US
dc.subject CAPABILITY en_US
dc.subject STRATEGY en_US
dc.subject DESIGN en_US
dc.title Development of fault-tolerant MLI topology en_US
dc.type Article en_US


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