Please use this identifier to cite or link to this item: https://dspace.library.iitb.ac.in/jspui/handle/100/13993
Title: Preparation and Properties of New Polyphenylene Sulfide/AlN Composites for Electronic Packaging
Authors: GOYAL, RK
JADHAV, P
TIWARI, AN
Keywords: Thermal-Conductivity
Melt Intercalation
Nanocomposites
Particles
Behavior
Expansion
Friction
Tio2
Wear
Issue Date: 2011
Publisher: SPRINGER
Citation: JOURNAL OF ELECTRONIC MATERIALS,40(6)1377-1383
Abstract: The thermal, mechanical, and dielectric properties of new high-performance polyphenylene sulfide/aluminum nitride (AlN) composites prepared by hot pressing were investigated for use in electronic packaging. The coefficient of thermal expansion was decreased by 41%. The glass-transition temperature and Vickers microhardness were increased by 13A degrees C and 46%, respectively, for the 15.1 vol.% AlN composite. A modified rule of mixtures with beta of 0.065 fits the data. The dielectric constant and loss factor of the composites are within the range of requirements for commercial use.
URI: http://dx.doi.org/10.1007/s11664-011-1520-5
http://dspace.library.iitb.ac.in/jspui/handle/100/13993
ISSN: 0361-5235
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