Institutional Repository IIT Bombay
Institutional repository of IIT Bombay is a research produced at IITB. Here we present a selection of our best research including full-text of book chapters, conference/proceeding papers,technical reports, journal pre-prints & post-prints, working papers, Patents and others like annual reports etc.
Email: dspace@iitb.ac.in
Browsing by Author MURALI, KVRM
Showing results 1 to 7 of 7
| Issue Date | Title | Author(s) |
| 2015 | Carrier Transport in High Mobility In As Nanowire Junction less Transistors | KONAR, A; MATHEW, J; NAYAK, K; BAJAJ, M; PANDEY, RK; DHARA, S; MURALI, KVRM; DESHMUKH, MM |
| 2014 | CMOS Logic Device and Circuit Performance of Si Gate All Around Nanowire MOSFET | NAYAK, K; BAJAJ, M; KONAR, A; OLDIGES, PJ; NATORI, K; IWAI, H; MURALI, KVRM; RAO, VR |
| 2012 | Effect of Band-to-Band Tunneling on Junctionless Transistors | GUNDAPANENI, S; BAJAJ, M; PANDEY, RK; MURALI, KVRM; GANGULY, S; KOTTANTHARAYIL, A |
| 2014 | Metal-Gate Granularity-Induced Threshold Voltage Variability and Mismatch in Si Gate-All-Around Nanowire n-MOSFETs | NAYAK, K; AGARWAL, S; BAJAJ, M; OLDIGES, PJ; MURALI, KVRM; RAO, VR |
| 2014 | Negative differential conductivity and carrier heating in gate-all-around Si nanowire FETs and its impact on CMOS logic circuits | NAYAK, K; BAJAJ, M; KONAR, A; OLDIGES, PJ; IWAI, H; MURALI, KVRM; RAO, VR |
| 2015 | Random Dopant Fluctuation Induced Variability in Undoped Channel Si Gate All Around Nanowire n-MOSFET | NAYAK, K; AGARWAL, S; BAJAJ, M; MURALI, KVRM; RAO, VR |
| 2013 | Understanding Process Impact of Hole Traps and NBTI in HKMG p-MOSFETs Using Measurements and Atomistic Simulations | MAHAPATRA, S; DE, S; JOSHI, K; MUKHOPADHYAY, S; PANDEY, RK; MURALI, KVRM |
