Data clustering using hierarchical deterministic annealing and higher order statistics

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Data clustering using hierarchical deterministic annealing and higher order statistics

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dc.contributor.author DESAI, UB en_US
dc.contributor.author RAJAGOPALAN, AN en_US
dc.contributor.author JAIN, AVINASH en_US
dc.date.accessioned 2008-11-21T06:46:59Z en_US
dc.date.accessioned 2011-11-25T12:30:15Z en_US
dc.date.accessioned 2011-12-26T13:04:53Z en_US
dc.date.accessioned 2011-12-27T05:50:55Z
dc.date.available 2008-11-21T06:46:59Z en_US
dc.date.available 2011-11-25T12:30:15Z en_US
dc.date.available 2011-12-26T13:04:53Z en_US
dc.date.available 2011-12-27T05:50:55Z
dc.date.issued 1999 en_US
dc.identifier.citation IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing 46(8), 1100-104 en_US
dc.identifier.issn 1057-7130 en_US
dc.identifier.uri http://dx.doi.org/10.1109/82.782060 en_US
dc.identifier.uri http://hdl.handle.net/10054/75 en_US
dc.identifier.uri http://dspace.library.iitb.ac.in/xmlui/handle/10054/75 en_US
dc.description.abstract In this brief, we propose an extension to the hierarchical deterministic annealing (HDA) algorithm for clustering by incorporating additional features into the algorithm. To decide a split in a cluster, the interdependency among all the clusters is taken into account by using the entire data distribution. A general distortion measure derived from the higher order statistics (HOS) of the data is used to analyze the phase transitions. Experimental results clearly demonstrate the improvement in the performance of the HDA algorithm when the interdependency among the clusters and the HOS of the data points are also utilized for the purpose of clustering. en_US
dc.language.iso en_US en_US
dc.publisher IEEE en_US
dc.subject genetic algorithms en_US
dc.subject perturbation techniques en_US
dc.subject signal distortion en_US
dc.subject simulated annealing en_US
dc.title Data clustering using hierarchical deterministic annealing and higher order statistics en_US
dc.type Article en_US
dc.description.copyright IEEE en_US


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