MICROSTRUCTURAL AND TRANSPORT-PROPERTIES OF LASER-ABLATED LUBA2CU3O7-DELTA THIN-FILMS

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MICROSTRUCTURAL AND TRANSPORT-PROPERTIES OF LASER-ABLATED LUBA2CU3O7-DELTA THIN-FILMS

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Title: MICROSTRUCTURAL AND TRANSPORT-PROPERTIES OF LASER-ABLATED LUBA2CU3O7-DELTA THIN-FILMS
Author: PINTO, R; GNANASEKAR, KI; KEER, HV; TAMHANE, AS; GUPTA, LC; VIJAYARAGHAVAN, R
Abstract: High-quality LuBa2Cu3O7-delta (LBCO) thin films have been grown on [100] LaAlO3 by pulsed laser deposition. Microstructural studies have indicated a high degree of c-axis orientation and an in-plane alignment. Transport measurements carried out on 10 mum wide microbridges of LBCO films have shown high critical current densities in the range 2-5 X 10(6) A cm-2 at 77 K. Self-field induced flux creep caused by transport currents has also been studied. However, the thickness-dependent effective microwave surface resistance, R(eff), measured using a microstrip resonator technique at the X band has shown a minimum at 3000 angstrom indicating film degradation above 3000 angstrom.
URI: http://dx.doi.org/10.1016/0921-4534(94)90365-4
http://dspace.library.iitb.ac.in/xmlui/handle/10054/6779
http://hdl.handle.net/10054/6779
Date: 1994


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