STOCHASTIC-ANALYSIS OF 2-UNIT SYSTEM SUBJECT TO 2 TYPES OF FAILURE

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STOCHASTIC-ANALYSIS OF 2-UNIT SYSTEM SUBJECT TO 2 TYPES OF FAILURE

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dc.contributor.author DHARMADHIKARI, AD en_US
dc.contributor.author VENKATACHALAM, P en_US
dc.date.accessioned 2011-08-26T15:32:28Z en_US
dc.date.accessioned 2011-12-26T12:57:30Z en_US
dc.date.accessioned 2011-12-27T05:42:18Z
dc.date.available 2011-08-26T15:32:28Z en_US
dc.date.available 2011-12-26T12:57:30Z en_US
dc.date.available 2011-12-27T05:42:18Z
dc.date.issued 1980 en_US
dc.identifier.citation MICROELECTRONICS AND RELIABILITY, 20(3), 343-345 en_US
dc.identifier.issn 0026-2714 en_US
dc.identifier.uri http://dx.doi.org/10.1016/0026-2714(80)90217-6 en_US
dc.identifier.uri http://dspace.library.iitb.ac.in/xmlui/handle/10054/11358 en_US
dc.identifier.uri http://hdl.handle.net/10054/11358
dc.language.iso en en_US
dc.publisher PERGAMON-ELSEVIER SCIENCE LTD en_US
dc.title STOCHASTIC-ANALYSIS OF 2-UNIT SYSTEM SUBJECT TO 2 TYPES OF FAILURE en_US
dc.type Article en_US


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