| dc.contributor.author |
DHARMADHIKARI, AD |
en_US |
| dc.contributor.author |
VENKATACHALAM, P |
en_US |
| dc.date.accessioned |
2011-08-26T15:32:28Z |
en_US |
| dc.date.accessioned |
2011-12-26T12:57:30Z |
en_US |
| dc.date.accessioned |
2011-12-27T05:42:18Z |
|
| dc.date.available |
2011-08-26T15:32:28Z |
en_US |
| dc.date.available |
2011-12-26T12:57:30Z |
en_US |
| dc.date.available |
2011-12-27T05:42:18Z |
|
| dc.date.issued |
1980 |
en_US |
| dc.identifier.citation |
MICROELECTRONICS AND RELIABILITY, 20(3), 343-345 |
en_US |
| dc.identifier.issn |
0026-2714 |
en_US |
| dc.identifier.uri |
http://dx.doi.org/10.1016/0026-2714(80)90217-6 |
en_US |
| dc.identifier.uri |
http://dspace.library.iitb.ac.in/xmlui/handle/10054/11358 |
en_US |
| dc.identifier.uri |
http://hdl.handle.net/10054/11358 |
|
| dc.language.iso |
en |
en_US |
| dc.publisher |
PERGAMON-ELSEVIER SCIENCE LTD |
en_US |
| dc.title |
STOCHASTIC-ANALYSIS OF 2-UNIT SYSTEM SUBJECT TO 2 TYPES OF FAILURE |
en_US |
| dc.type |
Article |
en_US |