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dc.contributor.authorDHARMADHIKARI, ADen_US
dc.contributor.authorVENKATACHALAM, Pen_US
dc.date.accessioned2011-08-26T15:32:28Zen_US
dc.date.accessioned2011-12-26T12:57:30Zen_US
dc.date.accessioned2011-12-27T05:42:18Z
dc.date.available2011-08-26T15:32:28Zen_US
dc.date.available2011-12-26T12:57:30Zen_US
dc.date.available2011-12-27T05:42:18Z
dc.date.issued1980en_US
dc.identifier.citationMICROELECTRONICS AND RELIABILITY, 20(3), 343-345en_US
dc.identifier.issn0026-2714en_US
dc.identifier.urihttp://dx.doi.org/10.1016/0026-2714(80)90217-6en_US
dc.identifier.urihttp://dspace.library.iitb.ac.in/xmlui/handle/10054/11358en_US
dc.identifier.urihttp://hdl.handle.net/10054/11358
dc.language.isoenen_US
dc.publisherPERGAMON-ELSEVIER SCIENCE LTDen_US
dc.titleSTOCHASTIC-ANALYSIS OF 2-UNIT SYSTEM SUBJECT TO 2 TYPES OF FAILUREen_US
dc.typeArticleen_US


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