| Title: | Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films (vol 233, pg 297, 2004) |
| Author: | VASA, P; SINGH, BP; TANEJA, P; AYYUB, P |
| URI: |
http://dx.doi.org/10.1016/j.optcom.2004.05.002
en http://dspace.library.iitb.ac.in/xmlui/handle/10054/13060 http://hdl.handle.net/100/63 |
| Date: | 2004 |
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