Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/xmlui/handle/123456789/21802
Title: Effect of parameter mismatch on the dynamics of strongly coupled self sustained oscillators
Authors: CHAKRABARTY, N
JAIN, A
LAL, N
DAS GUPTA, K
PARMANANDA, P
Keywords: Synchronization
Metronomes
Issue Date: 2017
Publisher: AMER INST PHYSICS
Citation: CHAOS,27(1)
Abstract: In this paper, we present an experimental setup and an associated mathematical model to study the synchronization of two self-sustained, strongly coupled, mechanical oscillators (metronomes). The effects of a small detuning in the internal parameters, namely, damping and frequency, have been studied. Our experimental system is a pair of spring wound mechanical metronomes; coupled by placing them on a common base, free to move along a horizontal direction. We designed a photodiode array based non-contact, non-magnetic position detection system driven by a microcontroller to record the instantaneous angular displacement of each oscillator and the small linear displacement of the base, coupling the two. In our system, the mass of the oscillating pendula forms a significant fraction of the total mass of the system, leading to strong coupling of the oscillators. We modified the internal mechanism of the spring-wound "clockwork" slightly, such that the natural frequency and the internal damping could be independently tuned. Stable synchronized and anti-synchronized states were observed as the difference in the parameters was varied in the experiments. The simulation results showed a rapid increase in the phase difference between the two oscillators beyond a certain threshold of parameter mismatch. Our simple model of the escapement mechanism did not reproduce a complete 180 degrees out of phase state. However, the numerical simulations show that increased mismatch in parameters leads to a synchronized state with a large phase difference. Published by AIP Publishing.
URI: http://dx.doi.org/10.1063/1.4974071
http://localhost:8080/xmlui/handle/123456789/21802
ISSN: 1054-1500
1089-7682
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