DSpace
 

DSpace at IIT Bombay >
IITB Publications >
Article >

Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/10054/9597

Title: Characterization of gem stones (rubies and sapphires) by energy-dispersive x-ray fluorescence spectrometry
Authors: JOSEPH, D
LAL, M
SHINDE, PS
PADALIA, BD
Issue Date: 2000
Publisher: JOHN WILEY & SONS LTD
Citation: X-RAY SPECTROMETRY, 29(2), 147-150
Abstract: Trace elemental analyses of rubies and sapphires from different countries of origin were carried out by the EDXRF technique. It was found that K, Ti, Cr, Fe, Cu, Zn, Sr and Ba are generally present in natural rubies and Cr, Ni, Cu and Zr in synthetic ruby. The synthetic ruby shows a clean spectrum devoid of iron whereas the presence of Fe is seen in all the naturally occurring rubies irrespective of the country of origin. The elements present in Indian sapphires are Ca, Fe, Sr and Mo and their estimated concentrations are 0.10, 0.18, 0.029 and 0.006%, respectively. Further, preliminary XRD studies showed patterns of synthetic rubies different from those of the naturally occurring rubies. The results demonstrate that EDXRF can be used to distinguish between natural and synthetic rubies. Copyright (C) 2000 , Ltd.
URI: http://dx.doi.org/10.1002/(SICI)1097-4539(200003/04)29:2<147::AID-XRS370>3.0.CO;2-K
http://dspace.library.iitb.ac.in/xmlui/handle/10054/9597
http://hdl.handle.net/10054/9597
ISSN: 0049-8246
Appears in Collections:Article

Files in This Item:

There are no files associated with this item.

View Statistics

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

 

Valid XHTML 1.0! DSpace Software Copyright © 2002-2010  Duraspace - Feedback