DSpace
 

DSpace at IIT Bombay >
IITB Publications >
Article >

Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/10054/7289

Title: Compositional characterization of CrN films deposited by ion beam-assisted deposition process on stainless steel
Authors: KUMAR, S
RAJU, VS
SHEKHAR, R
ARUNACHALAM, J
KHANNA, AS
PRASAD, KG
Keywords: wear-resistance
silicon
Issue Date: 2001
Publisher: ELSEVIER SCIENCE SA
Citation: THIN SOLID FILMS, 388(1-2), 195-200
Abstract: Thin films of technologically important chromium nitride, prepared using ion beam-assisted deposition (IBAD) on stainless steel, have been characterized for their composition and thickness by backscattering spectrometry and glow discharge mass spectrometry (GDMS). The composition of the films was determined by non-resonant N-14(p,p)N-14 backscattering using 1.6-1.73 MeV protons. The proton resonance N-14(p,p)N-14 scattering at E-p = 1.74 MeV and 3 MeV alpha -particle backscattering were used to measure the thickness of the films. The composition and thickness of the films estimated by the GDMS method are consistent with backscattering measurements. The factors leading to the formation of the peak observed at the iron edge of the: substrate in the backscattered spectra for both projectiles have been investigated. (C) 2001 Elsevier Science B,V. .
URI: http://dx.doi.org/10.1016/S0040-6090(01)00849-5
http://dspace.library.iitb.ac.in/xmlui/handle/10054/7289
http://hdl.handle.net/10054/7289
ISSN: 0040-6090
Appears in Collections:Article

Files in This Item:

There are no files associated with this item.

View Statistics

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

 

Valid XHTML 1.0! DSpace Software Copyright © 2002-2010  Duraspace - Feedback