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|Title:||Correlation of grain boundary nature with magnetization in RF-sputtered lithium-zinc ferrite thin films|
|Publisher:||ELSEVIER SCIENCE BV|
|Citation:||JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 321(20), 3373-3379|
|Abstract:||A significant advance in the understanding of grain boundary contribution to magnetization in nanocrystalline ferrite thin films is demonstrated in this paper. RF-sputtered, room-temperature deposited lithium-zinc ferrite thin films(Li(0.5-x/2)Zn(x)Mn(0.1)Fe(2.35-x/2)O(4), with x = 0.0, 0.16, 0.32 and 0.48) have been thermally annealed ex-situ at 850 degrees C and the in-plane magnetic measurements have been performed using a vibrating sample magnetometer. The percentage deviation between bulk and film magnetization(delta(M)) is observed to decrease with increasing Zn concentration, till x = 0.32, and then it increases. Macro-texture measurements using X-ray orientation distribution function and micro-texture measurements using orientation imaging microscopy show reverse trend in the extent of crystallographic texturing and in the computed fraction of low-angle grain boundaries. This study brings out a correlation between low-angle grain boundary concentration and delta(M). (C) 2009|
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