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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/10054/6462

Title: Correlation of grain boundary nature with magnetization in RF-sputtered lithium-zinc ferrite thin films
Authors: ADITYA, L
NANDA, J
SAMAJDAR, I
VENKATARAMANI, N
PRASAD, S
Keywords: pulsed-laser deposition
nanocrystalline materials
anisotropy
substrate
behavior
growth
Issue Date: 2009
Publisher: ELSEVIER SCIENCE BV
Citation: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 321(20), 3373-3379
Abstract: A significant advance in the understanding of grain boundary contribution to magnetization in nanocrystalline ferrite thin films is demonstrated in this paper. RF-sputtered, room-temperature deposited lithium-zinc ferrite thin films(Li(0.5-x/2)Zn(x)Mn(0.1)Fe(2.35-x/2)O(4), with x = 0.0, 0.16, 0.32 and 0.48) have been thermally annealed ex-situ at 850 degrees C and the in-plane magnetic measurements have been performed using a vibrating sample magnetometer. The percentage deviation between bulk and film magnetization(delta(M)) is observed to decrease with increasing Zn concentration, till x = 0.32, and then it increases. Macro-texture measurements using X-ray orientation distribution function and micro-texture measurements using orientation imaging microscopy show reverse trend in the extent of crystallographic texturing and in the computed fraction of low-angle grain boundaries. This study brings out a correlation between low-angle grain boundary concentration and delta(M). (C) 2009
URI: http://dx.doi.org/10.1016/j.jmmm.2009.05.073
http://dspace.library.iitb.ac.in/xmlui/handle/10054/6462
http://hdl.handle.net/10054/6462
ISSN: 0304-8853
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