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| Title: | Performance and reliability of single halo deep sub-micron p-MOSFETs for analog applications |
| Authors: | JHA, NK
BAGHINI, MS
RAMGOPAL RAO, V |
| Keywords: | mosfet
hot carriers
ion implantation
semiconductor device reliability
thermal stresses |
| Issue Date: | 2002 |
| Publisher: | IEEE
Xiang Luo Sarkar, S. |
| Citation: | Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits, Singapore, 8-12 July 2002, 35-39 |
| Abstract: | The effect of channel hot carrier (CHC) stress under typical analog operating conditions is studied for the first time for single halo (SH) p-MOSFET devices. The SH devices show less degradation under identical operating conditions compared to conventional MOSFETs. The effect of SH implant parameters on device degradation is presented. |
| URI: | 10.1109/IPFA.2002.1025608
http://hdl.handle.net/10054/591
http://dspace.library.iitb.ac.in/xmlui/handle/10054/591 |
| ISBN: | 0-7803-7416-9 |
| Appears in Collections: | Proceedings papers
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