|
DSpace at IIT Bombay >
IITB Publications >
Proceedings papers >
Please use this identifier to cite or link to this item:
http://dspace.library.iitb.ac.in/jspui/handle/10054/577
|
| Title: | Anhydrous silanization and antibody immobilization on hotwire CVD deposited silicon oxynitride films |
| Authors: | JOSHI, M
SINGH, S
SWAIN, B
PATIL, SAMADHAN B
DUSANE, RO
RAMGOPAL RAO, V
MUKHERJI, SOUMYA |
| Keywords: | thin films
ellipsometry
fluorescence
spectroscopic analysis |
| Issue Date: | 2004 |
| Publisher: | IEEE |
| Citation: | Proceedings of the IEEE INDICON India Annual Conference, Kharagpur, India, 20-22 December 2004, 538-541 |
| Abstract: | Hotwire CVD (HWCVD) deposited silicon rich nitride films were treated with O2 plasma using RF plasma setup. The thickness of this oxynitride film was measured using spectroscopic ellipsometry. The film was treated with [3-(2-aminoethyl) aminopropyl]-trimethoxysilane (AEAPS) followed by immobilization of human immunoglobulin (HIgG) on it. Surface morphology at various stages of experimentation was studied using AFM. Antibody immobilized surface is further investigated using fluorescence microscopy. |
| URI: | 10.1109/INDICO.2004.1497814
http://hdl.handle.net/10054/577
http://dspace.library.iitb.ac.in/xmlui/handle/10054/577 |
| ISBN: | 0-7803-8909-3 |
| Appears in Collections: | Proceedings papers
|
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
|
