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Title: Observation of thickness dependent properties in novel multiferroic thin films
Keywords: Dielectric Polarisation
Ferroelectric Thin Films
Magnetic Anisotropy
Pulsed Laser Deposition
Issue Date: 2007
Publisher: IEEE
Citation: Proceedings of the International Workshop on Physics of Semiconductor Devices, Mumbai, India, 16-20 December 2007, 933-935
Abstract: Multiferroics exhibit simultaneous coexistence of electric and magnetic ordering with coupling between two order parameters. These materials therefore find novel applications like multiple memories apart from MEMS sensors and actuators etc. Here we report the thickness dependent multiferroic properties of Bi0.7Dy0.3FeO3 films grown on Pt/TiO2/SiO2/Si substrate by pulsed laser deposition technique. In these films, magnetic anisotropy is developed non-linearly with the thickness. It is correlated to stress developed during growth process due lattice mismatch, difference in thermal coefficient, internal defects etc. The lattice cell parameter c also changes arbitrarily with the thickness of the film but correlates with stress. The saturation polarization (Ps) values scale with c parameter. The information obtained by this study would be significantly useful in innovative devices planned with this advanced material.
URI: 10.1109/IWPSD.2007.4472679
ISBN: 978-1-4244-1728-5
Appears in Collections:Proceedings papers

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