Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/xmlui/handle/10054/5462
Title: A NEW TECHNIQUE TO MEASURE FLAT BAND POTENTIAL AND BARRIER HEIGHT AT A DESIRED SURFACE-CHARGE OF NORMAL-SEMICONDUCTORS AND PARA-SEMICONDUCTORS
Authors: SHARON, M
PRASAD, BM
BASAVASWARAN, K
Issue Date: 1989
Publisher: COUNCIL SCIENTIFIC INDUSTRIAL RESEARCH
Citation: INDIAN JOURNAL OF CHEMISTRY SECTION A-INORGANIC BIO-INORGANIC PHYSICAL THEORETICAL & ANALYTICAL CHEMISTRY, 28(11), 935-941
URI: http://dspace.library.iitb.ac.in/xmlui/handle/10054/5462
http://hdl.handle.net/10054/5462
ISSN: 0376-4710
Appears in Collections:Article

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