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|Title: ||VIBRATIONAL-MODES IN ELECTRODEPOSITED AMORPHOUS-SILICON - FT-IR ANALYSIS|
|Authors: ||SARMA, PRL|
|Keywords: ||infrared-absorption spectra|
|Issue Date: ||1992|
|Publisher: ||CHAPMAN HALL LTD|
|Citation: ||JOURNAL OF MATERIALS SCIENCE, 27(17), 4762-4771|
|Abstract: ||Infrared spectra of 13 samples of amorphous silicon bonded with hydrogen, fluorine and carbon, prepared by electrodeposition using a mixture of ethylene glycol and fluosilicic acid were analysed in the wave number region 4000-400 cm-1 with a Fourier transform infrared spectrometer. Strong absorption peaks were observed at 1000 cm-1 due to the SiF(x) stretching mode. Small peaks were seen around 2300 and 640 cm-1 due to SiH stretching and wagging modes of absorption. The number of bonded hydrogen atoms in the film deposited at 0.05 M, 50 mA cm-2 was calculated to be 6.2579 x 10(21) and 1.2302 x 10(20) atm cm-3 using integrated absorption of the CH and SiH stretching modes, respectively. The absorption coefficient around the SiF(x) stretch region was found to vary from 1300-2500 cm-1 as the molarity of the electrolyte was increased. Binding energy shifts in X-ray photoelectron spectrum were used as a cross check to confirm the silicon bonding with carbon, hydrogen, oxygen and fluorine atoms. The absence of columnar growth in SEM photographs indicates no polysilane formation in the films.|
|Appears in Collections:||Article|
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