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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/10054/4752

Title: FULLERENES FROM CAMPHOR - A NATURAL SOURCE
Authors: MUKHOPADHYAY, K
KRISHNA, KM
SHARON, M
Keywords: electron-microscopy
c-60
c60
spectroscopy
films
superconductivity
separation
c-70
Issue Date: 1994
Publisher: AMERICAN PHYSICAL SOC
Citation: PHYSICAL REVIEW LETTERS, 72(20), 3182-3185
Abstract: Fullerenes are prepared from a natural source, camphor, for the first time. The films are deposited on a Si substrate, by a vacuum evaporation technique from the toluene extract of ether insoluble camphor soot. A fast atomic bombardment mass spectrum shows the presence of C60 along with other members of the fullerene family. Crystalline fullerene thin films grown on a Si wafer have been investigated by x-ray diffraction and scanning electron microscopy (SEM). X-ray diffraction measurements have identified that the crystals of C60 have the hexagonal close packed structure. SEM pictures reveal the surface distribution of spherical C60 clusters.
URI: http://dx.doi.org/10.1103/PhysRevLett.72.3182
http://dspace.library.iitb.ac.in/xmlui/handle/10054/4752
http://hdl.handle.net/10054/4752
ISSN: 0031-9007
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