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| Title: | FULLERENES FROM CAMPHOR - A NATURAL SOURCE |
| Authors: | MUKHOPADHYAY, K KRISHNA, KM SHARON, M |
| Keywords: | electron-microscopy c-60 c60 spectroscopy films superconductivity separation c-70 |
| Issue Date: | 1994 |
| Publisher: | AMERICAN PHYSICAL SOC |
| Citation: | PHYSICAL REVIEW LETTERS, 72(20), 3182-3185 |
| Abstract: | Fullerenes are prepared from a natural source, camphor, for the first time. The films are deposited on a Si substrate, by a vacuum evaporation technique from the toluene extract of ether insoluble camphor soot. A fast atomic bombardment mass spectrum shows the presence of C60 along with other members of the fullerene family. Crystalline fullerene thin films grown on a Si wafer have been investigated by x-ray diffraction and scanning electron microscopy (SEM). X-ray diffraction measurements have identified that the crystals of C60 have the hexagonal close packed structure. SEM pictures reveal the surface distribution of spherical C60 clusters. |
| URI: | http://dx.doi.org/10.1103/PhysRevLett.72.3182 http://dspace.library.iitb.ac.in/xmlui/handle/10054/4752 http://hdl.handle.net/10054/4752 |
| ISSN: | 0031-9007 |
| Appears in Collections: | Article
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