Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/xmlui/handle/10054/4334
Title: Enhanced J(c) and improved grain-boundary properties in Ag-doped YBa2Cu3O7-delta films
Authors: SELVAM, P
SEIBT, EW
KUMAR, D
PINTO, R
APTE, PR
Keywords: Auger-Electron Spectroscopy
Annealed Coevaporated Films
Critical-Current-Density
Thin-Films
Laser-Ablation
Silver
Superconductors
Composites
Transport
Ceramics
Issue Date: 1997
Publisher: AMER INST PHYSICS
Citation: APPLIED PHYSICS LETTERS, 71(1), 137-139
Abstract: A large increase (similar to 8 X) in critical current density, J(c), was achieved for in situ laser ablated YBa2Cu3O7-delta-Ag films. High-resolution Auger electron spectroscopic investigation indicates that the Ag-doped films are stoichiometric with a relatively low grain-boundary extension (8 nm) in contrast to undoped YBa2Cu3O7-delta films (32 nm). Further analysis suggests that the doped film contains a much lower silver content (<0.15 wt %) than in the target material (5 wt %). These observations are in excellent agreement with the temperature dependence of J(c), the room-temperature resistivity, and the surface resistance results. Thus, J(c) enhancement in Ag-doped films can be attributed to their superior properties, viz., improved microstructure characteristics and the reduced resistive grain boundaries. (C) 1997
URI: http://dx.doi.org/10.1063/1.119452
http://dspace.library.iitb.ac.in/xmlui/handle/10054/4334
http://hdl.handle.net/10054/4334
ISSN: 0003-6951
Appears in Collections:Article

Files in This Item:
There are no files associated with this item.


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.