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| Title: | An on-chip coupling capacitance measurement technique |
| Authors: | NAIR, PA
GUPTA, A
DESAI, MP |
| Keywords: | vlsi circuits
charge coupled device
coupled circuit
spatial variables measurement |
| Issue Date: | 2001 |
| Publisher: | IEEE |
| Citation: | Proceedings of the Fourteenth International Conference on VLSI Design, Banglore, India, 3-7 January 2001, 495-499 |
| Abstract: | We describe a technique for the accurate measurement of on-chip coupling capacitance using a Charge Based Coupling Capacitance Measurement (CBCCM) Technique. Detailed circuit simulations show that this method can measure sub-femtofarad coupling capacitance values, and can be used to isolate and measure components of device capacitance as well. |
| URI: | 10.1109/ICVD.2001.902707
http://hdl.handle.net/10054/398
http://dspace.library.iitb.ac.in/xmlui/handle/10054/398 |
| ISBN: | 0-7695-0831-6 |
| Appears in Collections: | Proceedings papers
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