|
DSpace at IIT Bombay >
IITB Publications >
Proceedings papers >
Please use this identifier to cite or link to this item:
http://dspace.library.iitb.ac.in/jspui/handle/10054/320
|
| Title: | Performance and reliability of high density flash EEPROMs under CHISEL programming operation |
| Authors: | MAHAPATRA, S
SHUKURI, S
BUDE, JD |
| Keywords: | flash memories
integrated circuit reliability
integrated memory circuits
integrated circuit design |
| Issue Date: | 2002 |
| Publisher: | IEEE |
| Citation: | Proceeding of the 32nd European Solid-State Device Research Conference, Scotland, UK, 24-26 September 2002, 351-354. |
| Abstract: | We demonstrate CHISEL programming operation of
fully scaled high-density flash EEPROMs. Single cell program and erase characteristics show reliable.
operation in terms of programming disturbs and cycling
induced degradation. Program and erase operation of
high-density arrays show a unique post-erase operation,
tight threshold voltage distribution and over 10 years of
data retention even after 105 program/erase cycles.
Results are presented showing the feasibility of CHISEL
programming operation for deeply scaled high-density
flash EEPROMs. |
| URI: | http://hdl.handle.net/10054/320
http://dspace.library.iitb.ac.in/xmlui/handle/10054/320 |
| ISBN: | 88-900847-8-2 |
| Appears in Collections: | Proceedings papers
|
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
|
