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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/10054/189

Title: Look-up table approach for RF circuit simulation using a novel measurement technique
Authors: AGARWAL, SN
JHA, ANURANJAN
VINAY KUMAR, D
VASI, J
PATIL, MB
RUSTAGI, SC
Keywords: mosfet
uhf amplifiers
uhf field effect transistors
circuit simulation
multiport networks
Issue Date: 2005
Publisher: IEEE
Citation: IEEE Transactions on Electron Devices 52(5), 973-979
Abstract: A simple and novel measurement technique to obtain three-port network-parameters of MOS transistors from two-port measurements on a single test structure is presented. The measured data is used in the form of a lookup table (LUT) for RF circuit simulation. It is shown that simulation results obtained with the LUT approach for a 2.4-GHz low-noise amplifier match very well with measurements, thus demonstrating the usefulness of the LUT approach. It is also shown that, for high frequencies, it is important to use the tables of y-parameters actually measured rather than those interpolated from low-frequency measurements. This is illustrated with a tuned amplifier simulation example.
URI: http://dx.doi.org/10.1109/TED.2005.846322
http://hdl.handle.net/10054/189
http://dspace.library.iitb.ac.in/xmlui/handle/10054/189
ISSN: 0018-9383
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