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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/10054/12607

Title: STUDY OF THE ORIGIN OF DOUBLE PEAKS IN THE CONDUCTANCE-VOLTAGE PLOTS OF AL-SIO2-SI CAPACITORS
Authors: SUNDARSINGH, VP
DAS, RP
Issue Date: 1984
Publisher: TAYLOR & FRANCIS LTD
Citation: INTERNATIONAL JOURNAL OF ELECTRONICS, 57(4), 535-541
URI: http://dx.doi.org/10.1080/00207218408938935
http://dspace.library.iitb.ac.in/xmlui/handle/10054/12607
http://hdl.handle.net/10054/12607
ISSN: 0020-7217
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