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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/10054/1114

Title: Erratum to Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films
Authors: VASA, PARINDA
SINGH, BP
TANEJA, PRAVEEN
AYYUB, PUSHAN
Keywords: interferometry
optical properties
absorption coefficients
nonlinear optical susceptibility
Issue Date: 2004
Publisher: Elsevier
Citation: Optics Communications 237(4-6), 451
Abstract: There is a critical need for a simple technique for the accurate measurement of weak optical nonlinearities such as the nonlinear coefficients of thin films. We discuss the experimental set-up and provide a realistic analysis for a sensitive and single beam technique based on an antiresonant ring interferometer for measuring nonlinear optical coefficients in thin films. The technique was benchmarked using toluene and its superiority was demonstrated by measuring the effective nonlinear absorption coefficient of a 1.3 μm thick CdS film, which could not be detected using standard techniques such as z-scan. We show that this technique can, in principle, be used for films with thickness down to the nanometer.
URI: http://dx.doi.org/10.1016/j.optcom.2004.05.002
http://hdl.handle.net/10054/1114
http://dspace.library.iitb.ac.in/xmlui/handle/10054/1114
ISSN: 0030-4018
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