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|Title:||On the transient behaviour of an r-out-of-n:G system|
|Publisher:||PERGAMON-ELSEVIER SCIENCE LTD|
|Citation:||MICROELECTRONICS AND RELIABILITY, 36(3), 409-413|
|Abstract:||In this paper, an r-out-of-n:G system with a single repair facility is analysed in connection with the cost incurred per unit time. A mathematical model is developed using the concept of semi-regenerative phenomena. Systems of convolution integral equations satisfied by various state probabilities corresponding to different initial conditions are obtained. An efficient iterative technique is used to solve the system of convolution integral equations and various measures of system performance are obtained.|
|Appears in Collections:||Article|
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