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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/10054/11066

Title: NCDP-plated CdSe film: Growth and characterization
Authors: KUMAR, M
SHARAN, MK
SHARON, M
Keywords: solar-cells
electrodes
Issue Date: 1998
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
Citation: MATERIALS RESEARCH BULLETIN, 33(1), 161-169
Abstract: Polycrystalline thin films of n-type CdSe (thickness 1-2 mu m) were grown on Zn substrates by noncatalytic displacement plating using aqueous solutions of CdSO4 and SeO2 in acidic pH. Thickness measurement nias performed by the chemical stripping method as well as by the capacitance method. The electrical characterization comprises ohmic contact study, resistivity, conductivity, and impedance measurements. The optical characterization was determined by photocurrent action spectrum and visible reflectance spectrum studies. Crystallographic structure and surface morphology were analyzed by X-ray diffraction and scanning electron microscopy. Average grain size of the order of micrometers and well-defined grain boundaries were observed. (C) 1998 .
URI: http://dx.doi.org/10.1016/S0025-5408(97)00187-6
http://dspace.library.iitb.ac.in/xmlui/handle/10054/11066
http://hdl.handle.net/10054/11066
ISSN: 0025-5408
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