Please use this identifier to cite or link to this item:
|Title:||Analysis of consecutive k-out-of-n: F systems with single repair facility|
|Publisher:||PERGAMON-ELSEVIER SCIENCE LTD|
|Citation:||MICROELECTRONICS AND RELIABILITY, 37(4), 587-590|
|Abstract:||In this paper, a consecutive k-out-of-n : F system with non-identical units and with a single repair facility is analyzed in connection with the reliability and availability of the system. The failure rates of the units are constant and the repair time is arbitrarily distributed. A mathematical model is developed using semi-regenerative phenomena and systems of convolution integral equations satisfied by various state probabilities corresponding to different initial conditions are obtained. A particular case with k = 2 and n = 3 is analyzed numerically to study the effect of various parameters on the availability and reliability of the system. Copyright (C) 1996 .|
|Appears in Collections:||Article|
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.