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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/10054/10518

Title: ANALYSIS OF A 2-UNIT REPAIRABLE SYSTEM WITH RANDOM INSPECTION SUBJECT TO 2 TYPES OF FAILURE
Authors: NAIDU, RS
GOPALAN, MN
Issue Date: 1983
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
Citation: MICROELECTRONICS AND RELIABILITY, 23(3), 449-451
URI: http://dspace.library.iitb.ac.in/xmlui/handle/10054/10518
http://hdl.handle.net/10054/10518
ISSN: 0026-2714
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