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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/10054/10413

Title: A FAULT MODEL FOR MULTIVALUED NMOS DYNAMIC RANDOM-ACCESS MEMORIES
Authors: NAIDU, RV
MAHAPATRA, S
Issue Date: 1989
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
Citation: MICROELECTRONICS AND RELIABILITY, 29(2), 137-143
URI: http://dspace.library.iitb.ac.in/xmlui/handle/10054/10413
http://hdl.handle.net/10054/10413
ISSN: 0026-2714
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