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| Title: | X-ray photoelectron spectroscopic study of the oxide film on an aluminum-tin alloy in 3.5% sodium chloride solution |
| Authors: | VENUGOPAL, A
VELUCHAMY, P
SELVAM, P
MINOURA, H
RAJA, VS |
| Keywords: | anodic passive films
point-defect model
electrochemical properties
stainless-steels
activation
behavior
esca
air
xps
fe |
| Issue Date: | 1997 |
| Publisher: | NATL ASSN CORROSION ENG |
| Citation: | CORROSION, 53(10), 808-812 |
| Abstract: | Oxide films on Al and an Al-Sn alloy were analyzed by x-ray photoelectron spectroscopy (XPS) after immersion in 3.5% sodium chloride (NaCl) solution. Results showed Sn exhibited both Sn2+ and Sn4+ oxidation states in the oxide film It was proposed that incorporation of these cations in the film would result in generation of more anionic and cationic vacancies in aluminum oxide (Al2O3), leading to active dissolution of Al. |
| URI: | http://dspace.library.iitb.ac.in/xmlui/handle/10054/10195
http://hdl.handle.net/10054/10195 |
| ISSN: | 0010-9312 |
| Appears in Collections: | Article
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