DSpace
 

DSpace at IIT Bombay >
IITB Publications >
Article >

Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/10054/100

Title: Investigation and modeling of interface and bulk trap generation during negative bias temperature instability of p-MOSFETs
Authors: MAHAPATRA, S
BHARATH KUMAR, P
ALAM, MA
Keywords: thermodynamic stability
high temperature effects
semiconductor device models
electric potential
Issue Date: 2004
Publisher: IEEE
Citation: IEEE Transactions on Electron Devices 51(9), 1377-79
Abstract: Negative bias temperature instability is studied in thick and thin gate oxide p-MOSFETs. The relative contributions of interface- and bulk-trap generation to this device degradation mode are analyzed for a wide range of stress bias and stress temperature. The effects of gate voltage and oxide field, as well as those of inversion layer holes, impact ionized hot holes, and hot electrons on interface- and bulk-trap generation, are identified. The bulk-trap generation process is interpreted within the modified anode-hole injection model and the mechanism of interface-trap generation is modeled within the framework of the classical reaction-diffusion theory. The diffusion species for interface-trap generation is unambiguously identified. Moreover, a high-temperature, diffusion-triggered, enhanced interface-trap generation mechanism is discussed for thin gate oxide p-MOSFETs. Finally, a novel scaling methodology is proposed for interface-trap generation that helps in obtaining a simple, analytical model useful for reliability projection.
URI: http://dx.doi.org/10.1109/TED.2004.833592
http://hdl.handle.net/10054/100
http://dspace.library.iitb.ac.in/xmlui/handle/10054/100
ISSN: 0018-9383
Appears in Collections:Article

Files in This Item:

File Description SizeFormat
29334589.25 kBUnknownView/Open
View Statistics

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

 

Valid XHTML 1.0! DSpace Software Copyright © 2002-2010  Duraspace - Feedback