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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/100/684

Title: A study of radiation effects on reoxidized nitrided-oxide mosfets, including effects on mobility
Authors: MALLIK, A
VASI, J
CHANDORKAR, AN
Issue Date: 1993
Publisher: PERGAMON-ELSEVIER SCIENCE LTD
Citation: SOLID-STATE ELECTRONICS,36(9)1359-1361
URI: http://dx.doi.org/10.1016/0038-1101(93)90179-T
http://dspace.library.iitb.ac.in/xmlui/handle/10054/13100
http://hdl.handle.net/100/684
ISSN: 0038-1101
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