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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/100/63

Title: Antiresonant ring interferometry as a sensitive technique for measuring nonlinear optical properties of thin films (vol 233, pg 297, 2004)
Authors: VASA, P
SINGH, BP
TANEJA, P
AYYUB, P
Issue Date: 2004
Citation: OPTICS COMMUNICATIONS,237,451-451
URI: http://dx.doi.org/10.1016/j.optcom.2004.05.002
en
http://dspace.library.iitb.ac.in/xmlui/handle/10054/13060
http://hdl.handle.net/100/63
ISSN: 0030-4018
Appears in Collections:Correction

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