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|Title:||Design and development of a MOV characterization unit with computer interface|
|Citation:||ASIAN JOURNAL OF PHYSICS, VOL 6 NOS 1 AND 2, JANUARY-MARCH 1997: PROCEEDINGS OF THE DAE-BRNS SYMPOSIUM ON ELECTROCERAMICS,69-76|
|Abstract:||The design of a pulsed computer controlled V-I characterization unit for obtaining the characteristic of Metal Oxide Varistors (MOVs) is presented here. Details of the apparatus, its evaluation and application to standard resistors as well as commercially available varistors are presented in this paper. The non linear coefficient ct of the varistors has been measured and is found to vary between 29 - 66 for varistors ranging from 40 - 150 V.|
|Appears in Collections:||Proceedings papers|
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