Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/xmlui/handle/100/2298
Title: Comparison of negative bias temperature instability in HfSiO(N)/TaN and SiO(N)/poly-Si pMOSFETs
Authors: MAHETA, VD
PURAWAT, S
GUPTA, G
Keywords: Mosfets
Issue Date: 2007
Publisher: IEEE
Citation: IPFA 2007: PROCEEDINGS OF THE 14TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS,91-95
URI: http://dspace.library.iitb.ac.in/xmlui/handle/10054/15902
http://hdl.handle.net/100/2298
ISBN: 978-1-4244-1014-9
Appears in Collections:Proceedings papers

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