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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/100/2294

Title: Thin film Single Halo (SH) SOI nMOSFETs short channel performance in mixed signal applications
Authors: HAKIM, NUD
RAO, VR
VASI, J
Issue Date: 2004
Publisher: IEEE
Citation: Proceedings of the IEEE INDICON 2004,525-529
Abstract: In this paper, for the first. time, we report a study on the short channel performance of Single Halo (SH) thin film Silicon-on-Insulators (SOI) nMOSFETs. for mixed signal applications. The single halo structure has a high pocket impurity concentration near the source end of the channel and a low impurity concentration in the rest of the channel. Besides having excellent dc output characteristics, better V-th - L roll-off control, lower DIBL, higher breakdown voltages and kink free-operation, these devices. show higher ac transconductance, higher output resistance and better dynamic Intrinsic gain. The experimental results have also shown that SH SOI MOSFETs exhibit lower hot carrier degradation In comparison with the conventional (CON) homogeneously doped SOI MOSFETs. The lower. capacitance near the drain region due to low impurity concentration Is also beneficial In analog Applications.
URI: http://dx.doi.org/10.1109/INDICO.2004.1497811
http://dspace.library.iitb.ac.in/xmlui/handle/10054/15520
http://hdl.handle.net/100/2294
ISBN: 0-7803-8909-3
Appears in Collections:Proceedings papers

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