DSpace at IIT Bombay >
IITB Publications >
Proceedings papers >
Please use this identifier to cite or link to this item:
|Title: ||Improvement in reliability of MEMS resonator using multi-layers|
|Authors: ||APTE, PR|
|Issue Date: ||2004|
|Publisher: ||SPIE-INT SOC OPTICAL ENGINEERING|
|Citation: ||RELIABILITY, TESTING AND CHARACTERIZATION OF MEMS/MOEMS III,5343,31-36|
|Abstract: ||Many promising applications of MEMS based devices are in critical systems. Hence, their reliability has become an important issue. The techniques used for the fabrication of these devices give rise to large residual stresses. This coupled with their high speeds of operation make them prone to fatigue failure. The focus of this work is the improvement of reliability under fatigue loading using multi-layers. This paper demonstrates that by adjusting the thickness ratios, the stress in a multi-layered resonator can be prevented from alternating. Moreover, the peak stress can be minimized and performance can be improved in harsh environments.|
|Appears in Collections:||Proceedings papers|
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.