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| Title: | Investigations of nano size defects in InP induced by swift iron ions |
| Authors: | DUBEY, RL
DUBEY, SK
YADAV, AD
GUPTA, SJ
PANDEY, SD
RAO, TKG
MOHANTY, T
KANJILAL, D |
| Keywords: | x-ray-diffraction
damage formation
crystalline inp
irradiation
gaas |
| Issue Date: | 2007 |
| Publisher: | ELSEVIER SCIENCE BV |
| Citation: | NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,257,287-292 |
| Abstract: | Indium phosphide (InP) samples were irradiated with swift (100 MeV) Fe-56(7+) ions with different fluences varying from 5 x 10(12) to 2 x 10(14) cm(-2) at room temperature. Atomic force microscopy (AFM) and high resolution X-ray diffraction (HRXRD) have been used to investigate the irradiation effects. AFM observations revealed the presence of nanosized defect clusters in all irradiated InP samples. Size (diameter) and density of defect clusters was found as a function of ion fluence. Root mean square (r.m.s) surface roughnesses measured using the Nanoscope software supplied with the AFM instrument were found to change from 0.33 nm to 7.49 nm. HRXRD studies revealed the presence of radiation-damaged layer (strained peak) in high fluence (2 x 10(14) cm(-2)) Fe ion irradiated InP. The screw dislocations, out of plane strain and lattice mismatch of irradiated samples have been studied. (c) 2007 Elsevier B.V. All rights reserved. |
| URI: | http://dx.doi.org/10.1016/j.nimb.2007.01.093
http://dspace.library.iitb.ac.in/xmlui/handle/10054/15017
http://hdl.handle.net/100/1776 |
| ISSN: | 0168-583X |
| Appears in Collections: | Proceedings papers
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