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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/100/1776

Title: Investigations of nano size defects in InP induced by swift iron ions
Authors: DUBEY, RL
DUBEY, SK
YADAV, AD
GUPTA, SJ
PANDEY, SD
RAO, TKG
MOHANTY, T
KANJILAL, D
Keywords: x-ray-diffraction
damage formation
crystalline inp
irradiation
gaas
Issue Date: 2007
Publisher: ELSEVIER SCIENCE BV
Citation: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS,257,287-292
Abstract: Indium phosphide (InP) samples were irradiated with swift (100 MeV) Fe-56(7+) ions with different fluences varying from 5 x 10(12) to 2 x 10(14) cm(-2) at room temperature. Atomic force microscopy (AFM) and high resolution X-ray diffraction (HRXRD) have been used to investigate the irradiation effects. AFM observations revealed the presence of nanosized defect clusters in all irradiated InP samples. Size (diameter) and density of defect clusters was found as a function of ion fluence. Root mean square (r.m.s) surface roughnesses measured using the Nanoscope software supplied with the AFM instrument were found to change from 0.33 nm to 7.49 nm. HRXRD studies revealed the presence of radiation-damaged layer (strained peak) in high fluence (2 x 10(14) cm(-2)) Fe ion irradiated InP. The screw dislocations, out of plane strain and lattice mismatch of irradiated samples have been studied. (c) 2007 Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.nimb.2007.01.093
http://dspace.library.iitb.ac.in/xmlui/handle/10054/15017
http://hdl.handle.net/100/1776
ISSN: 0168-583X
Appears in Collections:Proceedings papers

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