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|Title: ||Mossbauer study of interface mixing in FE/NI multilayers|
|Authors: ||ACHARYA, BR|
|Issue Date: ||1995|
|Publisher: ||ELSEVIER SCIENCE BV|
|Citation: ||JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS,140,555-556|
|Abstract: ||Conversion Electron Mossbauer Spectroscopy (GEMS) studies were carried out on as deposited and annealed Fe/Ni multilayers prepared by rf sputtering, in order to probe the interface. A series of multilayers in which Ni layer thickness was fixed at 25 Angstrom and the Fe layer thickness was varied from 18 to 120 Angstrom, were studied. The width of the Mossbauer lines increases with decreasing Fe layer thickness indicating a mixing at the interface, which was analyzed using specific models.|
|Appears in Collections:||Proceedings papers|
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