Please use this identifier to cite or link to this item:
|Title:||Flux-creep in YBA2CU3O7-Y thin-films induced by self-field of the transport current|
|Publisher:||PERGAMON-ELSEVIER SCIENCE LTD|
|Abstract:||Self-field induced flux creep has been studied in YBa2Cu3O7-y thin films in zero external field at temperatures below T(c). Self-field induced flux creep model, which is the extension of Anderson and Kim conventional flux creep model has been introduced. The verification of the model has been done by performing voltage-current measurements on patterned YBa2Cu3O7-y thin films. The variation of pinning potential, U0, as function of temperature is obtained.|
|Appears in Collections:||Proceedings papers|
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.