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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/100/14261

Title: Healing of Broken Multiwalled Carbon Nanotubes Using Very Low Energy Electrons in SEM: A Route Toward Complete Recovery
Authors: KULSHRESTHA, N
MISRA, A
HAZRA, KS
ROY, S
BAJPAI, R
MOHAPATRA, DR
MISRA, DS
Keywords: FILMS
XPS
IRRADIATION
BREAKDOWN
BEAM
Issue Date: 2011
Publisher: AMER CHEMICAL SOC
Citation: ACS NANO,5(3)1724-1730
Abstract: We report the healing of electrically broken multiwalled carbon nanotubes (MWNTs) using very low energy electrons (3-10 keV) In scanning electron microscopy (SEM). Current-induced breakdown caused by Joule heating has been achieved by applying suitably high voltages. The broken tubes were examined and exposed to electrons of 3-10 keV in situ in SEM with careful maneuvering of the electron beam at the broken site, which results In the mechanical joining of the tube. Electrical recovery of the same tube has been confirmed by performing the current-voltage measurements after joining. This easy approach is directly applicable for the repairing of carbon nanotubes incorporated In ready devices, such as in on chip horizontal interconnects or on tip probing applications, such as in scanning tunneling microscopy.
URI: http://dx.doi.org/10.1021/nn102288u
http://dspace.library.iitb.ac.in/jspui/handle/100/14261
ISSN: 1936-0851
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