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|Title:||Magnetotransport and structural properties of nanocrystalline FeAgAl thin films|
|Publisher:||AMER SCIENTIFIC PUBLISHERS|
|Citation:||JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY,8(8)4068-4072|
|Abstract:||Structural and magnetotransport properties of metallic FexAgyAlz nanogranular thin films were studied. These films with several compositions were prepared by do magnetron sputtering. X-ray diffraction (XRD) measurements carried out on the samples show only Ag(111) peaks. The d-spacings determined from the Ag(111) peaks are smaller than the standard value for bulk Ag indicating a partial substitution of Fe and AI atoms in Ag matrix. Transmission electron diffraction (TEM) patterns show a number of Ag rings. Both XRD and TEM studies did not reveal any diffraction peaks due to Fe or AI. The average particle size determined from the TEM micrograph is 5.9 nm. This value is in good agreement with the grain size determined from the XRD patterns for the AI substituted samples. The MR was found to increase for smaller AI concentration and it decreases with further increase in AI content. In the samples investigated magnetoresistance ratio reaches a maximum value of about 4.5% for the Fe27Ag63Al10 film.|
|Appears in Collections:||Proceedings papers|
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