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|Title: ||Comparative study of methods of the determination of Kearns parameter in zirconium|
|Authors: ||KRISHNA, KVM|
|Issue Date: ||2011|
|Publisher: ||ELSEVIER SCIENCE BV|
|Citation: ||JOURNAL OF NUCLEAR MATERIALS,414(3)492-497|
|Abstract: ||Various methods of Kearns "f" parameter evaluation were compared for their consistency and dependency on measurement cross section of the sample and variation in the microstructure across different cross sections. The study showed that, EBSD (Electron Back Scattered Diffraction) method is more consistent in comparison to X-ray based techniques for the "f" parameter determination especially in case of recrystallized microstructures. (C) 2011 Elsevier B.V. All rights reserved.|
|Appears in Collections:||Article|
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