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Please use this identifier to cite or link to this item: http://dspace.library.iitb.ac.in/jspui/handle/100/1347

Title: Microstructural studies to probe textured growth of sputtered strontium ferrite thin films
Authors: ACHARYA, BR
SUNDARARAMAN, M
VENKATARAMANI, N
PRASAD, S
SHRINGI, SN
KRISHNAN, R
Keywords: media
Issue Date: 1996
Publisher: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Citation: IEEE TRANSACTIONS ON MAGNETICS,32(5)4544-4546
Abstract: Sputtered strontium ferrite films upon annealing at higher temperatures show different textures depending on the deposition parameters as if these parameters leave their signature which eventually decides the texture. To understand the origin of this phenomena the 'as deposited' sputtered strontium ferrite films were studied using transmission electron microscopy, The study showed that the 'as deposited' films were made up of microcrystallites which were not detected by X-ray diffraction. The study also hinted some kind of texture in the 'as deposited' films, which might be responsible for the final texture of the films when annealed at higher temperatures.
URI: http://dx.doi.org/10.1109/20.539075
http://dspace.library.iitb.ac.in/xmlui/handle/10054/14527
http://hdl.handle.net/100/1347
ISSN: 0018-9464
Appears in Collections:Proceedings papers

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