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|Title:||Microstructural studies to probe textured growth of sputtered strontium ferrite thin films|
|Publisher:||IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC|
|Citation:||IEEE TRANSACTIONS ON MAGNETICS,32(5)4544-4546|
|Abstract:||Sputtered strontium ferrite films upon annealing at higher temperatures show different textures depending on the deposition parameters as if these parameters leave their signature which eventually decides the texture. To understand the origin of this phenomena the 'as deposited' sputtered strontium ferrite films were studied using transmission electron microscopy, The study showed that the 'as deposited' films were made up of microcrystallites which were not detected by X-ray diffraction. The study also hinted some kind of texture in the 'as deposited' films, which might be responsible for the final texture of the films when annealed at higher temperatures.|
|Appears in Collections:||Proceedings papers|
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