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Browsing by Author WERKING, JD

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Issue DateTitleAuthor(s)
1998Charge injection using gate-induced-drain-leakage current for characterization of plasma edge damage in CMOS devicesBROZEK, T; RAMGOPAL RAO, V; SRIDHARAN, A; WERKING, JD; CHAN, YD; VISWANATHAN, CR
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